Search results for "Device under test"
showing 3 items of 3 documents
Electromagnetic radiated field measurements for partial discharge diagnostic
2004
Recently, improvements have been made in the diagnostic of electrical insulation systems by means of electric Partial Discharge (PD) standard measurements through a stochastic approach in the treatment of the acquired data: in this way, the identification of the defects as well as the separation of multiple defects simultaneously active, have been successfully performed. However, the standard PD measurement process can be affected by the well-known parasitic effects due to conducted noise whose spectrum can have characteristics similar to those of the measured signal. Moreover, the classic PD measurement system have to be suitable assembled on the Device Under Test (DUT) so determining a co…
A PC-based low cost impedance and gain-phase analyzer
2008
Abstract In this paper, we present a practical and inexpensive impedance/gain-phase analyzer (IGPA), which is very useful in the design of electronic circuits. This instrument allows the Bode diagram of any network or electronic circuit with an input and an output to be obtained, even though this implementation was not previously known. It can also obtain the module and phase diagrams of any impedance separately. The device under test (DUT) is connected to a personal computer (PC) via the parallel port by means of an electronic circuit implemented for this purpose. The results are shown on the screen of the PC and can be accessible for use in any further operation. The instrument operates i…
Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs
2019
This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for th…